Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques

Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare measurements on flexible electronics using three different techniques: four-point probe, microwave resonator terahertz time-domain spectroscopy. Multiple samples were examined, facilitating the comparison techniques. Sheet resistance values at DC, frequencies obtained found to be in close agreement.